atomic force microscopy (afm) bruker multimode 8 microscope with scanasyst mode Search Results


atomic force microscopy  (Bruker Corporation)
99
Bruker Corporation atomic force microscopy
Atomic Force Microscopy, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/MultiMode+8/pmc11133347-249-0-3
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multimode 8 atomic force microscope  (Digital Instruments Inc)
90
Digital Instruments Inc multimode 8 atomic force microscope
Multimode 8 Atomic Force Microscope, supplied by Digital Instruments Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/atomic+force+microscope+multimode+8/pm36703510-236-6-11
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multimode 8 atomic force microscope - by Bioz Stars, 2026-10
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ht7800  (Hitachi Ltd)
99
Hitachi Ltd ht7800
Ht7800, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/HT7800/custom%40ht7800%4031886646
Average 99 stars, based on 1 article reviews
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su8600  (Hitachi Ltd)
99
Hitachi Ltd su8600
Su8600, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/SU8600/custom%40su8600%4028337987
Average 99 stars, based on 1 article reviews
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su9000  (Hitachi Ltd)
99
Hitachi Ltd su9000
Su9000, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/SU9000/custom%40su9000%4028337987
Average 99 stars, based on 1 article reviews
su9000 - by Bioz Stars, 2026-10
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tm4000  (Hitachi Ltd)
99
Hitachi Ltd tm4000
Tm4000, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/TM4000/custom%40tm4000%4010%2E1002%2Fapp%2E50479
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tm4000 - by Bioz Stars, 2026-10
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transmission electron microscopy tem  (JEOL)
99
JEOL transmission electron microscopy tem
Transmission Electron Microscopy Tem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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transmission electron microscopy tem - by Bioz Stars, 2026-10
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asyelec.01-r2  (Asylum Research Inc)
90
Asylum Research Inc asyelec.01-r2
(a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: <t>ASYELEC.01-R2</t> (Asylum Research, k ∼ 2.8 N·m –1 ).
Asyelec.01 R2, supplied by Asylum Research Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/asyelec+01+r2+ti+ir+coated+tip/pmc09134503-8-58-59
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dls spectroscopy  (HORIBA Ltd)
99
HORIBA Ltd dls spectroscopy
(a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: <t>ASYELEC.01-R2</t> (Asylum Research, k ∼ 2.8 N·m –1 ).
Dls Spectroscopy, supplied by HORIBA Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/SZ-100/10__1364_slash_oe__27__003200-23-29-31
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afm stm metal specimen discs  (Ted Pella)
86
Ted Pella afm stm metal specimen discs
(a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: <t>ASYELEC.01-R2</t> (Asylum Research, k ∼ 2.8 N·m –1 ).
Afm Stm Metal Specimen Discs, supplied by Ted Pella, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/afm+metal+pucks/bio_rxiv__2021__07__02__450731-145-234-239
Average 86 stars, based on 1 article reviews
afm stm metal specimen discs - by Bioz Stars, 2026-10
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v1 afm mica discs  (Ted Pella)
86
Ted Pella v1 afm mica discs
(a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: <t>ASYELEC.01-R2</t> (Asylum Research, k ∼ 2.8 N·m –1 ).
V1 Afm Mica Discs, supplied by Ted Pella, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+(afm)+bruker+multimode+8+microscope+with+scanasyst+mode/coverslips+glass/bio_rxiv__2021__07__02__450731-145-223-228
Average 86 stars, based on 1 article reviews
v1 afm mica discs - by Bioz Stars, 2026-10
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Image Search Results


(a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ).

Journal: ACS Nano

Article Title: Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

doi: 10.1021/acsnano.1c11107

Figure Lengend Snippet: (a) AFM phase image revealing bright and dark triangular moiré phase domains. Color scale: from 101° to 104°. (b) KPFM image acquired from the same region as (a), showing a moiré superlattice, characterized by AB and BA stacking domains. Color scale: from −60 to +60 mV. Image processing: 11th polynomial background removal. (c) Dissipation energy map obtained in the same region as (a) and (b), providing a moiré pattern. Color scale: from 4.7 to 6.4 eV. (d) Schematic of adjacent AA stacked hBN layers characterized by a zero net polarization. (e) AB stacking configuration where a negative electric dipole emerges. (f) BA stacking with a positive electric dipole. All the representations of d–f are not in scale. Imaging parameters for (a,c): A 0 = 16.3 nm, A = 15.7 nm, free phase ∼88.2°. Cantilever: 240AC-NG (OPUS, k ∼ 2 N·m –1 ). Imaging parameters for (b): A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. Cantilever: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ).

Article Snippet: AFM/phase/KPFM measurements are taken at ∼25 °C (RH ∼ 40%), using a Multimode 8 (Bruker) AFM microscope, with Scanasyst Fluid (Bruker, k ∼ 0.7 N·m –1 , v ∼ 150 kHz), Scanasyst Air HR (Bruker, k ∼ 0.4 N·m –1 , v ∼ 130 kHz), 240AC-NG (OPUS, k ∼ 2 N·m –1 , v ∼ 70 kHz), and ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 , v ∼ 75 kHz) cantilevers.

Techniques: Imaging

(a) Tapping mode AFM topography of a WSe 2 /WSe 2 (2.1 nm/2.9 nm, θ twist ∼ 0°). (b) Corresponding KPFM image addressing a moiré pattern highlighted by black and white dash lines. (c) Tapping mode AFM phase image of the red square zoomed area (see panel b): the same moiré contrast visualized by KPFM can be distinguished. Cantilever KPFM: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ). Imaging parameters: A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. KPFM image processing: flattening, line correction, 11th order polynomial. The z-scale is logarithmic to enhance the contrast. Cantilever phase-imaging: Scanasyst air (Bruker, k ∼ 0.7 N·m –1 ). Imaging parameters: A 0 ∼ 5 nm, A ∼ 4 nm, free phase ∼88°.

Journal: ACS Nano

Article Title: Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

doi: 10.1021/acsnano.1c11107

Figure Lengend Snippet: (a) Tapping mode AFM topography of a WSe 2 /WSe 2 (2.1 nm/2.9 nm, θ twist ∼ 0°). (b) Corresponding KPFM image addressing a moiré pattern highlighted by black and white dash lines. (c) Tapping mode AFM phase image of the red square zoomed area (see panel b): the same moiré contrast visualized by KPFM can be distinguished. Cantilever KPFM: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ). Imaging parameters: A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. KPFM image processing: flattening, line correction, 11th order polynomial. The z-scale is logarithmic to enhance the contrast. Cantilever phase-imaging: Scanasyst air (Bruker, k ∼ 0.7 N·m –1 ). Imaging parameters: A 0 ∼ 5 nm, A ∼ 4 nm, free phase ∼88°.

Article Snippet: AFM/phase/KPFM measurements are taken at ∼25 °C (RH ∼ 40%), using a Multimode 8 (Bruker) AFM microscope, with Scanasyst Fluid (Bruker, k ∼ 0.7 N·m –1 , v ∼ 150 kHz), Scanasyst Air HR (Bruker, k ∼ 0.4 N·m –1 , v ∼ 130 kHz), 240AC-NG (OPUS, k ∼ 2 N·m –1 , v ∼ 70 kHz), and ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 , v ∼ 75 kHz) cantilevers.

Techniques: Imaging

(a,c) Topography, (b,d) KPFM maps. (c,d) Zoom of (a,b). Cantilever: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ). Imaging parameters: A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. KPFM image processing: flattening, line correction, 11th order polynomial.

Journal: ACS Nano

Article Title: Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride

doi: 10.1021/acsnano.1c11107

Figure Lengend Snippet: (a,c) Topography, (b,d) KPFM maps. (c,d) Zoom of (a,b). Cantilever: ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 ). Imaging parameters: A 0 ∼ 25 nm, A ∼ 10 nm, lift height = 3 nm, drive voltage = 1 V. KPFM image processing: flattening, line correction, 11th order polynomial.

Article Snippet: AFM/phase/KPFM measurements are taken at ∼25 °C (RH ∼ 40%), using a Multimode 8 (Bruker) AFM microscope, with Scanasyst Fluid (Bruker, k ∼ 0.7 N·m –1 , v ∼ 150 kHz), Scanasyst Air HR (Bruker, k ∼ 0.4 N·m –1 , v ∼ 130 kHz), 240AC-NG (OPUS, k ∼ 2 N·m –1 , v ∼ 70 kHz), and ASYELEC.01-R2 (Asylum Research, k ∼ 2.8 N·m –1 , v ∼ 75 kHz) cantilevers.

Techniques: Imaging